|
Stress Optical Coefficient
|
4.15 (nm/cm)/(kg/cm3)
[0.292(nm/cm)psi] |
| Abbe'Number(vd) | 53.1 |
| Refractive index (nominal CTE material) |
nD (589 nm) 1.4828 nC (656 nm) 1.4801 |
| dn/dt |
20-40°C 10.68 x 10-6/°C
40-60°C 11.24 x 10-6/°C |
|
Mean coefficient of thermal expansion
5ºC to 35ºC |
0 ± 30 x 10-9/K
[0 ± 30 ppb/ºC] |
| Thermal Conductivity (K) | 1.31 w/(m • ºC) [1.13 kcal/(m • hr • ºC)] |
| Thermal diffusity (D) | 0.0079 cm2/s |
| D.C. volume resistivity, 200ºC 100Hz (R) | 10 11.6 ohm • cm |
| Mean specific heat (Cp) | 767 J/ (kg • ºC) [0.183 cal/(g • ºC)] |
| Strain point | 890ºC [1634 ºF] |
| Annealing point | 1000ºC [1832 ºF] |
| Softening point | 1490ºC [2714 ºF] |
| A pplying Fields: |
LCD TV, computer monitor
Glass substrate of notebook computer Ceramic carriers and filters for mobile emission control systems Optical fiber, optical cable, hardware and equipment for communication network Optical biosensors for drug development Optics in semiconductors, aerospace, defense, astronomy and Metrology |
| * **** |
|
Stress Optical Coefficient
|
4.15 (nm/cm)/(kg/cm3)
[0.292(nm/cm)psi] |
| Abbe'Number(vd) | 53.1 |
| Refractive index (nominal CTE material) |
nD (589 nm) 1.4828 nC (656 nm) 1.4801 |
| dn/dt |
20-40°C 10.68 x 10-6/°C
40-60°C 11.24 x 10-6/°C |
|
Mean coefficient of thermal expansion
5ºC to 35ºC |
0 ± 30 x 10-9/K
[0 ± 30 ppb/ºC] |
| Thermal Conductivity (K) | 1.31 w/(m • ºC) [1.13 kcal/(m • hr • ºC)] |
| Thermal diffusity (D) | 0.0079 cm2/s |
| D.C. volume resistivity, 200ºC 100Hz (R) | 10 11.6 ohm • cm |
| Mean specific heat (Cp) | 767 J/ (kg • ºC) [0.183 cal/(g • ºC)] |
| Strain point | 890ºC [1634 ºF] |
| Annealing point | 1000ºC [1832 ºF] |
| Softening point | 1490ºC [2714 ºF] |
| A pplying Fields: |
LCD TV, computer monitor
Glass substrate of notebook computer Ceramic carriers and filters for mobile emission control systems Optical fiber, optical cable, hardware and equipment for communication network Optical biosensors for drug development Optics in semiconductors, aerospace, defense, astronomy and Metrology |
| * **** |